The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Jun. 25, 2015
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Alexander Shpunt, Tel Aviv, IL;

Benny Pesach, Rosh HaAyin, IL;

Ronen Akerman, Modiin, IL;

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2518 (2013.01); G06T 17/00 (2013.01);
Abstract

Apparatus for mapping includes a radiation source, which is configured to emit a beam of radiation. A first scanning mirror is configured to receive and scan the emitted beam in a first direction over a selected angular range within a region of interest. A detector and optics define a sensing area of the detector. A second scanning mirror is configured to scan the sensing area over the selected angular range in the first direction in synchronization with the scanned beam from the radiation source. A scanner is configured to scan both the emitted beam and the sensing area over the region of interest in a second direction, which is perpendicular to the first direction. A processor is configured to process signals output by the detector in order to construct a three-dimensional (3D) map of an object in the region of interest.


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