The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
Oct. 06, 2015
National Taiwan Ocean University, Keelung, TW;
Wen-Tung Chang, Taipei, TW;
Jian-Hong Wu, Nantou County, TW;
National Taiwan Ocean University, Keelung, TW;
Abstract
A non-destructive and optical measurement automation system for web thickness of microdrills and method thereof can obtain the measuring data corresponding to a certain section to be measured of a microdrill by means of automated optical measurement. Specifically speaking, the said system and method measure the section to be measured via an optical measuring plane formed by a measuring light beam, and the included angle between the optical measuring plane and the central axis of the microdrill is practically consistent with the helix angle of the microdrill. The said system and method then analyze the measuring data via a computer device to obtain the outer diameter and the depths of helical flutes corresponding to the section to be measured. Finally, the said system and method calculate the web thickness of the said section to be measured according to the outer diameter and the depths of helical flutes.