The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
Mar. 28, 2013
Applicant:
Ucl Business Plc, London, GB;
Inventors:
Rodolfo Hermans, London, GB;
Gabriel Aeppli, London, GB;
Assignee:
UCL Business PLC, London, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01Q 20/02 (2010.01); G01S 17/02 (2006.01); G01B 11/255 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/2441 (2013.01); G01B 11/255 (2013.01); G01S 17/026 (2013.01); G01Q 20/02 (2013.01);
Abstract
A method of measuring surface curvature comprises forming an intensity distribution defined by Fresnel diffraction, wherein said intensity distribution is formed by electromagnetic radiation reflected from a surface, obtaining data for the intensity distribution and determining information relating to the curvature of the surface using the obtained data.
Hermans, Rodolfo. (2017). Measuring surface curvature (U.S. Patent No. 9677875). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9677875
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile