The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
Jan. 31, 2014
Grs Valtech, Vaulx-en-Velin, Paris, FR;
Matthieu Hirrien, Villeurbanne, FR;
Marc Messalier, Saint Michael d'Euzet, FR;
GRS VALTECH, Paris, FR;
AREVA NC, Courbevoie, FR;
Abstract
A method for sorting, in a continuous flow, contaminated materials, which includes: conveying materials from a point (A) to a point (B) by means of a conveyor; measuring the radioactive activity by means of a first sensor between the points (A) and (B) on the top surface (FSUP) of the first conveyor; and sorting the materials by means of a sorting device. The method may include measuring the radioactive activity of the contaminated material by means of a second sensor, either on the top surface (FSUP) of the conveyor and upstream from the point (A), or below the bottom surface (FINF) of said conveyor; calculating a differential measurement between a measurement from the second sensor and from the first sensor; and restricting the sorting to the comparison between a threshold value and the measurement from the first sensor or the differential measurement.