The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Mar. 13, 2015
Applicant:

Elenza, Inc., Roanoke, VA (US);

Inventors:

Ronald D. Blum, Roanoke, VA (US);

Amitava Gupta, Roanoke, VA (US);

Jean-Noel Fehr, Bern, CH;

Jean-Christophe Roulet, Bern, CH;

Urban Schnell, Bern, CH;

Walter Doll, Bern, CH;

Roland Michaely, Bern, CH;

Assignee:

ELENZA, INC., Roanoke, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 3/30 (2006.01); A61F 2/16 (2006.01); A61F 2/14 (2006.01); G02F 1/1341 (2006.01); H05K 3/36 (2006.01); A61F 2/48 (2006.01); H01L 23/15 (2006.01); H01L 23/538 (2006.01);
U.S. Cl.
CPC ...
A61F 2/1624 (2013.01); A61F 2/14 (2013.01); G02F 1/1341 (2013.01); H05K 3/301 (2013.01); H05K 3/36 (2013.01); A61F 2/1613 (2013.01); A61F 2002/482 (2013.01); A61F 2240/001 (2013.01); A61F 2250/0069 (2013.01); H01L 23/15 (2013.01); H01L 23/5389 (2013.01); Y10T 29/49126 (2015.01);
Abstract

Many modern implantable ophthalmic devices include electronic components, such as electro-active cells, that can leak harmful substances into the eye and/or surrounding tissue. In the implantable ophthalmic devices disclosed herein, electronic components are hermetically sealed within cavities formed by bonding together two or more glass wafers. Bonding the glass wafers together with laser fusion bonding, pressure bonding, or anodic bonding creates a seal that leaks at a rate of less than about 5×10Pa mswhen subjected to a helium leak test. Hermetically sealed feedthroughs formed of conductive material running through channels in the wafers provide electrical connections to components inside the sealed cavities. In some cases, the conductive material has a coefficient of thermal expansion (CTE) that is roughly equal to (e.g., within 10% of) the CTE of the glass wafers to minimize leakage due to thermally induced expansion and contraction of the conductive material and the glass wafer.


Find Patent Forward Citations

Loading…