The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
Mar. 22, 2016
Applicant:
Kabushiki Kaisha Topcon, Itabashi-ku, JP;
Inventor:
Shigetaka Tsuri, Itabashi-ku, JP;
Assignee:
KABUSHIKI KAISHA TOPCON, Itabashi-ku, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/102 (2013.01); A61B 3/14 (2013.01); A61B 5/7275 (2013.01);
Abstract
According to one embodiment, an ophthalmic examination apparatus includes an examination unit and an analyzer. The examination unit is used to optically examine a subject's eye. The analyzer is configured to analyze examination data obtained by the examination unit, and thereby generate risk information indicating the risk of a specific disease.