The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
May. 05, 2016
Aquifi, Inc., Palo Alto, CA (US);
Pietro Salvagnini, Sunnyvale, CA (US);
Michele Stoppa, Sunnyvale, CA (US);
Abbas Rafii, Palo Alto, CA (US);
Aquifi, Inc., Palo Alto, CA (US);
Abstract
A method for detecting decalibration of a depth camera system including a first, second, and third cameras having overlapping fields of view in a direction includes: detecting a feature in a first image captured by the first camera; detecting the feature in a second image captured by the second camera; detecting the feature in a third image captured by the third camera, the third camera being non-collinear with the first and second cameras; identifying a first conjugate epipolar line in the second image in accordance with a detected location of the feature in the first image and calibration parameters; identifying a second conjugate epipolar line in the second image in accordance with a detected location of the feature in the third image and the calibration parameters; and calculating a difference between a detected location of the feature in the second image and the first and second conjugate epipolar lines.