The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Dec. 01, 2015
Applicant:
Dual Aperture International Co., Ltd., Seongnam-si, Gyeonggi-do, KR;
Inventors:
Andrew Wajs, Haarlem, NL;
Hyunsang Park, Cheonam, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/357 (2011.01); G06K 9/46 (2006.01); H04N 5/33 (2006.01); H04N 9/64 (2006.01); H04N 9/73 (2006.01); H04N 5/232 (2006.01); H04N 9/04 (2006.01); H04N 5/217 (2011.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 5/357 (2013.01); G06K 9/4604 (2013.01); H04N 5/217 (2013.01); H04N 5/2258 (2013.01); H04N 5/23212 (2013.01); H04N 5/23229 (2013.01); H04N 5/33 (2013.01); H04N 5/332 (2013.01); H04N 9/045 (2013.01); H04N 9/64 (2013.01); H04N 9/73 (2013.01);
Abstract
A method to correct an image in a dual-aperture camera. Infrared noise may be subtracted from a pixel of an RGB image by the amount proportional to the distance from the corresponding edge to minimize imaging defects in a dual aperture camera. Such defect minimization may prevent edge information from being lost. A method reduces the effect of false color along the edges by converting inconsistent color edges to more consistent monochrome edges using the YCbCr color space.