The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Aug. 13, 2015
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Hye Jin Kam, Seongnam-si, KR;
Ye Hoon Kim, Seoul, KR;
Seung Chul Chae, Seoul, KR;
Byung Kon Kang, Gwangju-si, KR;
Ha Young Kim, Yongin-si, KR;
Ki Yong Lee, Suwon-si, KR;
Joo Hyuk Jeon, Seoul, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); H04N 5/232 (2006.01); G06T 7/00 (2017.01); A61B 8/00 (2006.01); A61B 8/08 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23293 (2013.01); A61B 8/4245 (2013.01); A61B 8/5223 (2013.01); G06K 9/00973 (2013.01); G06K 9/6227 (2013.01); G06K 9/6253 (2013.01); G06T 7/0012 (2013.01); A61B 8/469 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/20008 (2013.01);
Abstract
An apparatus and method for adaptive computer-aided diagnosis (CAD) are provided. The adaptive CAD apparatus includes an image analysis algorithm selector configured to select an image analysis algorithm based on a speed of a probe or a resolution of a current image frame obtained by the probe; and an image analyzer configured to detect and classify a region of interest (ROI) in the current image frame using the selected image analysis algorithm.