The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Aug. 08, 2013
Applicant:

Siemens Aktiengesellschaft, München, DE;

Inventors:

Jens-Uwe Buβer, Neubiberg, DE;

Kai Fischer, Baldham, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 21/56 (2013.01); G06F 21/64 (2013.01); G06F 21/57 (2013.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1458 (2013.01); G06F 17/30371 (2013.01); G06F 21/565 (2013.01); G06F 21/57 (2013.01); G06F 21/64 (2013.01); H04L 63/1416 (2013.01); G06F 2221/033 (2013.01);
Abstract

The embodiments relate to a method and a test system for testing integrity of property data of a device using a testing device within a network, the devices and their respective property data within the network, such as all the measurement or control device distributed inside an industrial automation system, being taken into account in order to simplify testing of a large number of devices. The various property data are tested for an identity and are labelled, and calculations, which are carried out by the testing device for testing purposes, are initiated on the basis of the labelling. By taking other devices in the system into account, security requirements may be fulfilled during testing and the computational effort for the testing device may also be reduced.


Find Patent Forward Citations

Loading…