The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Jan. 05, 2016
Applicant:

Ixia, Calabasas, CA (US);

Inventor:

David Jennings Wicker, Jr., Hillsboro, OR (US);

Assignee:

Ixia, Calabasas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/04 (2006.01); H04L 25/03 (2006.01); H04L 5/00 (2006.01); H04L 27/26 (2006.01); H04B 7/0413 (2017.01);
U.S. Cl.
CPC ...
H04L 25/03019 (2013.01); H04B 7/0413 (2013.01); H04L 5/006 (2013.01); H04L 27/2665 (2013.01);
Abstract

Systems and methods are disclosed herein to provide automatic identification of radio frequency (RF) transmitter chains during the testing of wireless data communication devices and systems, including Multiple Input Multiple Output (MIMO) devices and systems utilizing beamforming. In accordance with one or more embodiments, a signal analysis function is disclosed that identifies the ordinal index of each MIMO RF transmitter chain associated with a Device Under Test (DUT) using the Cyclic Shift Delay (CSD) imposed on the transmitted MIMO signal. Such a system may offer improved capabilities such as automated detection of mis-cabled test setups, automated recovery from mis-cabling, and automated adaptation of transmitted test signals to counteract the effects of mis-cabling.


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