The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Jun. 15, 2016
Keysight Technologies, Inc., Minneapolis, MN (US);
David L. Gines, Fort Collins, CO (US);
Steven Draving, Colorado Springs, CO (US);
Min Jie Chong, Colorado Springs, CO (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A measurement instrument and associated method: receive at a measurement instrument at least one victim signal from a device under test (DUT), the victim signal including crosstalk interference from one or more aggressor signals which are not received by the measurement instrument; extract from the victim signal an ideal data pattern for the received victim signal, where the ideal data pattern does not include intersymbol interference (ISI), a noise component, or crosstalk interference to the victim signal; ascertain from the received victim signal and the ideal data pattern the ISI for the victim signal; produce a difference signal as a difference between: (1) the received victim signal; and (2) a sum of the ideal data pattern and the ISI; and ascertain from the difference signal a sum of the noise component and the crosstalk interference from one or more aggressor signals which are not received by the measurement instrument.