The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Aug. 21, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Sarveswara Bade, Bangalore, IN;

Shiu Chung Ho, Essex Junction, VT (US);

Marcel A. Kossel, Reichenburg, CH;

Pradeep Thiagarajan, Chapel Hill, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 17/16 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
H03K 17/16 (2013.01); G01R 31/00 (2013.01); H03K 17/162 (2013.01);
Abstract

A method and system for reducing leakage current in a testing circuit are provided. Embodiments include a testing circuit that includes a digital buffer that includes a first transistor operatively coupled to a second transistor, where a drain of the first transistor is operatively coupled to a source of the second transistor. The second transistor is switched into cutoff mode. The digital buffer also includes a reference voltage generation circuit. The reference voltage generation circuit is operatively connected to the drain of the first transistor and the source of the second transistor. The reference voltage generation circuit is configured to reduce the leakage current in the digital buffer.


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