The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Jun. 02, 2014
Applicant:
Mitsubishi Electric Corporation, Tokyo, JP;
Inventors:
Satoru Sonoda, Tokyo, JP;
Kengo Kato, Tokyo, JP;
Assignee:
Mitsubishi Electric Corporation, Tokyo, JP;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 5/1252 (2006.01); H03K 19/173 (2006.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
H03K 5/1252 (2013.01); H03K 19/173 (2013.01); H03K 2005/00013 (2013.01);
Abstract
A noise analysis apparatus has a plurality of digital filters and a noise analysis unit. The plurality of digital filters have mutually different filtering characteristics and filter a same input signal to output a plurality of output signals, respectively. The noise analysis unit detects presence or absence of a noise in the input signal, based on the plurality of output signals. More specifically, the noise analysis unit detects the presence or absence of the noise in the input signal, based on whether or not values of the plurality of output signals coincide with each other.