The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Jun. 23, 2011
Applicants:

David Perreault, Brookline, MA (US);

Robert Pilawa-podgurski, Cambridge, MA (US);

Charles Sullivan, West Lebanon, NH (US);

Alexander Latham, Norwich, VT (US);

Inventors:

David Perreault, Brookline, MA (US);

Robert Pilawa-Podgurski, Cambridge, MA (US);

Charles Sullivan, West Lebanon, NH (US);

Alexander Latham, Norwich, VT (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02J 1/00 (2006.01); H02M 7/44 (2006.01); G05F 1/571 (2006.01); H01L 31/02 (2006.01); H02M 1/00 (2006.01); H02J 3/38 (2006.01); G05F 1/67 (2006.01);
U.S. Cl.
CPC ...
H02M 7/44 (2013.01); G05F 1/571 (2013.01); H01L 31/02021 (2013.01); H02J 3/383 (2013.01); G05F 1/67 (2013.01); H02J 3/385 (2013.01); H02M 2001/0077 (2013.01); Y02E 10/563 (2013.01); Y10T 307/685 (2015.04); Y10T 307/707 (2015.04);
Abstract

High power output may be obtained from a photovoltaic (PV) system by controlling each photovoltaic cell of a solar array individually to operate at its maximum power point. Each cell may have associated power electronics and control circuitry that may be integrated together on a chip which may be advantageously implemented in CMOS, enabling reductions in cost and size. A perturb and observe algorithm may be used to find the maximum power point by measuring the power produced at different operating points, and modifying the operating point in the direction of increased power production. In one aspect, performance of a perturb and observe algorithm may be improved in the presence of noise.


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