The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

May. 17, 2011
Applicants:

Dean P. Jones, Decatur, GA (US);

Quinlyn A. Soltow, Atlanta, GA (US);

Inventors:

Dean P. Jones, Decatur, GA (US);

Quinlyn A. Soltow, Atlanta, GA (US);

Assignee:

Emory University, Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); H01J 49/00 (2006.01); G06F 19/12 (2011.01); G06F 17/10 (2006.01); G06F 19/24 (2011.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); G06F 17/10 (2013.01); G06F 19/12 (2013.01); G06F 19/24 (2013.01); H01J 49/0036 (2013.01);
Abstract

Described herein are computer-readable storage mediums, methods and systems useful for analyzing samples via mass spectrometry. Aspects described herein include methods for normalizing mass spectrometry data that include providing a reference set of mass spectrometry data obtained from a first external standard sample having one or more isotopic standards, wherein the reference set of mass spectrometry data comprises one or more m/z intensity ratios. Methods described herein are useful for reducing errors based on instrument response and ionization efficiencies and improve reproducibility of data from instrument to instrument and from day to day.


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