The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Sep. 11, 2015
Fanuc Corporation, Yamanashi, JP;
Yuuta Namiki, Yamanashi, JP;
Fumikazu Warashina, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A contour line measurement apparatus includes an edge line extraction unit for setting a picture processing region and extracting an edge line from an object picture in each of the regions, an edge point generation unit for generating edge points which are intersections of the edge lines and epipolar lines, a corresponding point selection unit for selecting, from the plurality of edge points, a pair of edge points corresponding to the same portion of the reference contour line, and a three dimensional point calculation unit for calculating a three dimensional point on the contour line of the object on the basis of lines of sight of cameras which pass the pair of edge points.