The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Jun. 03, 2014
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Stefan Grosskopf, Nuremberg, DE;

Jing Lu, Shanghai, CN;

Daniel Ruzicka, Nuremberg, DE;

Michael Scheuering, Nuremberg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0022 (2013.01); G06F 19/321 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/30004 (2013.01);
Abstract

In a method and apparatus to automatically generate a selected image data set from an entirety of medical measurement data of an examination subject, the entirety of the measurement data of the examination subject is received as input data, and at least a portion of the measurement data is automatically analyzed with regard to a number of specific, topologically representative content feature parameter values of the examination subject selected measurement data from the entirety is made, with the selected data associated with defined, specific, topologically representative content feature parameter values. The selected measurement data are assembled into a selected image data set, as output data.


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