The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Oct. 21, 2016
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Yoichi Yaguchi, Hino, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An image sequence acquisition section acquires an image sequence including a plurality of images. A processing section performs an image summarization process that acquires a summary image sequence based on first and second deletion determination processes that delete some of the images included in the acquired image sequence. The processing section sets an attention image sequence including one at least one attention image included in the plurality of images, selects a first reference image from the attention image sequence, selects a first determination target image from the plurality of images, and performs the first deletion determination process that determines whether the first determination target image can be deleted based on first deformation information that represents deformation between the first reference image and the first determination target image. The processing section sets a partial image sequence from the image sequence, a plurality of images that have been determined to be allowed to remain by the first deletion determination process being consecutively arranged in the partial image sequence. The processing section selects a second reference image and a second determination target image from the partial image sequence, and performs the second deletion determination process that determines whether the second determination target image can be deleted based on second deformation information that represents deformation between the second reference image and the second determination target image.