The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Sep. 17, 2014
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventors:

Leo Parker Dirac, Seattle, WA (US);

Michael Brueckner, Berlin, DE;

Ralf Herbrich, Brandenburg, DE;

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01);
Abstract

Variables of observation records to be used to generate a machine learning model are identified as candidates for quantile binning transformations. In accordance with a particular concurrent binning plan generated for a particular variable, a plurality of quantile binning transformations are applied to the particular variable, including a first transformation with a first bin count and a second transformation with a different bin count. The first and second transformations result in the inclusion of respective parameters or weights for binned features in a parameter vector of the model. In a post-training phase run of the model, at least one parameter corresponding to a binned feature is used to generate a prediction.


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