The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Feb. 04, 2014
Applicant:

Microsoft Corporation, Redmond, WA (US);

Inventors:

Christian Liensberger, Bellevue, WA (US);

Ziv Kasperski, Redmond, WA (US);

Stéphane Nyombayire, Bellevue, WA (US);

Venkatesh Krishnan, SDammamish, WA (US);

Santosh Balasubramanian, Seattle, WA (US);

Kunal Mukerjee, Redmond, WA (US);

Shankar L. Regunathan, Redmond, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30542 (2013.01); G06F 17/30554 (2013.01); G06F 17/30566 (2013.01);
Abstract

The present invention extends to methods, systems, and computer program products for creating data views. Embodiments of the invention allow automatic creation of data views/projections on top of data sources. A view can be created on one data source (by looking at one or multiple data elements within the data source) or by looking at multiple data sources (of the same or different data types) and combining elements into a view. Data sources can be any kind of data source, including but not limited to: databases, files, and Web services. Views can be picked from a set of predefined views, picked from views of another tenant (either statically or using fuzzy logic), selected based on data element classifications and/or data element relationship classifications, selected based on data usage (e.g., by looking at logs), etc.


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