The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Mar. 15, 2013
Electric Power Research Institute, Palo Alto, CA (US);
Luke Breon, Concord, NC (US);
Michael J Quarry, Charlotte, NC (US);
Joseph L. Rose, State College, PA (US);
Ehsan Khajeh, Spring, TX (US);
ELECTRIC POWER RESEARCH INSTITUTE, Palo Alto, CA (US);
The Penn State Research Foundation, University Park, PA (US);
Abstract
A non-destructive testing system includes directing guided wave energy to regions of interest in waveguides. Knowing the propagation paths taken by guided wave energy in complex waveguides can be used to intentionally insonify regions of interest. Additionally, knowledge of the propagation direction and location of an energy mode in a waveguide allows the calculation of the path previously taken by the energy mode. This information can be used for signal processing of guided wave inspection systems. The test system can have various sensor configurations including: a single transducer configured to direct or receive guided wave energy along a particular direction, a one-dimensional array or a two dimensional array of transducers. The transducers can operate independently to provide mutual phasing and amplitude adjusting to steer guided wave energy in a waveguide or determine the directionality of guided wave energy received by the sensors.