The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Jun. 06, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Matthew Gadzinski, Marlboro, NY (US);

Anthony G. Gorey, Fishkill, NY (US);

Richard W. Gregory, Poughkeepsie, NY (US);

Rohan A. Jones, Poughkeepsie, NY (US);

Michel H. Joseph, Poughkeepsie, NY (US);

Kurt J. Leuchten, Poughkeepsie, NY (US);

Gerald G. Stanquist, Salt Point, NY (US);

Brian W. Stocker, Port Ewen, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); Y02P 90/04 (2015.11); Y02P 90/14 (2015.11); Y02P 90/20 (2015.11);
Abstract

A fulfillment test of a computing system having components is performed within a build-to-order test phase. Responsive to the fulfillment test failing, the component that most contributed to the fulfillment test failing is replaced, regardless of whether the given component was determined to be suspect or marginally defective pursuant to a fabrication test previously performed within a build-to-plan test phase. Any other component of that contributed to the fulfillment test failing and that was determined to be suspect or marginally defective pursuant to the fabrication test previously performed within the build-to-plan test phase is also replaced.


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