The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Feb. 22, 2016
Applicant:

Accenture Global Services Limited, Dublin, IE;

Inventors:

Qian Zhu, Mountain View, CA (US);

Teresa Tung, San Jose, CA (US);

Qing Xie, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06Q 10/00 (2012.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06F 11/0703 (2013.01); G06F 11/0709 (2013.01); G06F 11/079 (2013.01); G06Q 10/00 (2013.01); G06Q 10/0639 (2013.01);
Abstract

According to an example, an adaptive fault diagnosis system may include a memory storing machine readable instructions to receive metrics and events from an enterprise system, and use a substitution graph to determine if a received metric or a received event belongs to a cluster that includes one or more correlated metrics and/or events grouped based on similarity. If the received metric or the received event belongs to the cluster, the memory may further store machine readable instructions to use a detection graph to determine if the received metric or the received event is identifiable to form a fault pattern by traversing a fault path of the detection graph. Further, the memory may further store machine readable instructions to diagnose a fault based on the traversal of the fault path of the detection graph. The system may include a processor to implement the machine readable instructions.


Find Patent Forward Citations

Loading…