The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Mar. 10, 2015
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Ravinder Devarajan, Cary, NC (US);

Himesh G. Patel, Apex, NC (US);

Pat Berryman, Cary, NC (US);

Lisa Hope Everdyke, Durham, NC (US);

Bradley Edward Morris, Raleigh, NC (US);

Christopher Kendrick Edwards, Raleigh, NC (US);

Jordan Riley Benson, Ellerbe, NC (US);

Timothy Joel Erikson, Wendell, NC (US);

Assignee:

SAS Institute Inc., Cary, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G06F 3/0486 (2013.01); G06F 17/30 (2006.01); H04L 29/08 (2006.01); G06T 11/60 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0486 (2013.01); G06F 17/30554 (2013.01); G06F 17/30958 (2013.01); G06T 11/206 (2013.01); G06T 11/60 (2013.01); H04L 67/02 (2013.01); G06T 2200/24 (2013.01); G06T 2200/32 (2013.01); G06T 2207/20072 (2013.01); G06T 2211/428 (2013.01);
Abstract

In a method of computing sample data to render a graph element, first sample data is computed to render a first graph element type. A second indicator is received that indicates a second graph element type to present overlaid with the first graph element type. Second sample data is computed to render the second graph element type. Third sample data is computed to render a second instance of the first graph element type. The second instance of the first graph element type is rendered overlaid with the second graph element type using the computed second and third sample data. A first number of points computed for the second sample data is the same as a second number of points computed for the third sample data. A common axis is used, and the first number of points is determined based on a data type of the common axis.


Find Patent Forward Citations

Loading…