The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Mar. 17, 2014
Applicant:
Applied Materials, Inc., Santa Clara, CA (US);
Inventors:
David Everton Norman, Bountiful, UT (US);
Keith Pare, Austin, TX (US);
Steve Marteney, Park City, UT (US);
Madhav R. Kidambi, Glen Allen, VA (US);
Fumio Kawada, Gifu, JP;
Assignee:
APPLIED MATERIALS, INC., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41865 (2013.01); G05B 2219/32258 (2013.01); G05B 2219/32263 (2013.01); Y02P 90/20 (2015.11);
Abstract
Methods and systems are provided for filtering lot schedules of a manufacturing facility. A first schedule is identified, in which the first schedule is a previously executed schedule. A processing device generates a pool of lots to be scheduled using information from the first schedule, in which the pool of lots is a subset of a plurality of lots associated with the first schedule. The processing device generates a second schedule using the pool of lots.