The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Aug. 20, 2015
Palantir Technologies Inc., Palo Alto, CA (US);
Mitchell Beard, Falls Church, VA (US);
Kai Shen, Jersey City, NJ (US);
Roger Hu, New York City, NY (US);
Sachi Shah, San Francisco, CA (US);
Miklos Danka, London, GB;
Laurynas Pliuskys, London, GB;
Thomas Pearson, Twickenham, GB;
Palantir Technologies Inc., Palo Alto, CA (US);
Abstract
A system comprising a computer-readable storage medium storing at least one program and a method for determining, tracking, and anticipating risk in a manufacturing facility are presented. In example embodiments, the method includes obtaining operational data associated with a manufacturing facility. The method further includes accessing a risk data model corresponding to the manufacturing facility, and calculating a risk score based on the current operational data using the risk data model. The method further includes causing presentation of a user interface that includes a display of the risk score to provide a user with a measure of risk at the manufacturing facility.