The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Jul. 13, 2015
Omron Corporation, Kyoto-shi, Kyoto, JP;
Kazunori Okamoto, Kusatsu, JP;
Minoru Hashimoto, Ritto, JP;
Keisaku Kikuchi, Kyoto, JP;
Kazunori Osako, Kusatsu, JP;
OMRON Corporation, Kyoto-shi, JP;
Abstract
A detection processing unit determines, in a detection area including optical axes formed between emitter elements and receiver elements, whether each optical axis is in an interrupted state after optical axis selection corresponding to one scan, and outputs a detection signal based on the determination result. When at least one of the optical axes is constantly interrupted by an object movable within the detection area, the detection processing unit outputs the detection signal upon determining that the number of optical axes in an interrupted state is greater than a preset maximum optical axis number, and also outputs the detection signal upon determining that the number of optical axes in an interrupted state is smaller than a preset minimum optical axis number.