The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Sep. 19, 2014
Applicants:

Hongchuan Sun, Spring, TX (US);

Feng Deng, Houston, TX (US);

Carey M. Marcinkovich, The Woodlands, TX (US);

Inventors:

Hongchuan Sun, Spring, TX (US);

Feng Deng, Houston, TX (US);

Carey M. Marcinkovich, The Woodlands, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/34 (2006.01); G01V 1/28 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/303 (2013.01); G01V 2210/514 (2013.01); G01V 2210/522 (2013.01); G01V 2210/6222 (2013.01);
Abstract

Method for estimating reflector dips in a window of post stack image traces () of seismic data for use in velocity tomography (). The method iteratively () flattens () the image traces against a specified reference trace through the application of conjugate-gradient least-squares inversion (). Different from other dip estimation methods which emphasize on strong-amplitude reflectors, the inventive method automatically inverts for the reflector dip for every grid point in the image window.


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