The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Mar. 15, 2013
Applicant:

Litepoint Corporation, Sunnyvale, CA (US);

Inventors:

Minh-Chau Huynh, San Mateo, CA (US);

Dirk J. M. Walvis, Santa Cruz, CA (US);

Yinghui Li, San Jose, CA (US);

Assignee:

LitePoint Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H04B 17/11 (2015.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); H04B 17/11 (2015.01); H04B 17/21 (2015.01);
Abstract

A system and method to facilitate wireless testing of a radio frequency (RF) multiple-input, multiple-output (MIMO) signal transceiver device under test (DUT). With the DUT operating in a controlled electromagnetic environment, the tester transmits multiple test signals wirelessly to the DUT. Signal phases of the respective test signals transmitted by the tester are controlled in accordance with feedback signal data from the DUT. Magnitudes of the respective test signals can also be controlled in accordance with such feedback signal data, thereby enabling dynamic optimization of the wireless communication channel condition number k(H).


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