The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Sep. 30, 2011
Applicants:

Yong Up Park, Daejeon, KR;

Won Suck Choi, Seoul, KR;

Byung Sung Lee, Daejeon, KR;

Sun Kyu Choi, Daejeon, KR;

Kil Sin Kim, Daejeon, KR;

Seok Gon Kim, Daejeon, KR;

Sang-jun Kim, Daejeon, KR;

Inventors:

Yong Up Park, Daejeon, KR;

Won Suck Choi, Seoul, KR;

Byung Sung Lee, Daejeon, KR;

Sun Kyu Choi, Daejeon, KR;

Kil Sin Kim, Daejeon, KR;

Seok Gon Kim, Daejeon, KR;

Sang-Jun Kim, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 25/00 (2006.01); G01R 29/16 (2006.01);
U.S. Cl.
CPC ...
G01R 25/00 (2013.01); G01R 29/16 (2013.01);
Abstract

There are provided a method and device for detecting a zero phase component. The device for detecting a zero phase component includes a meter chip of a sequential sampling method, a data acquiring unit configured to acquire sequential data on a plurality of phases from the meter chip, and a zero phase current value calculating unit configured to calculate an instantaneous current value for fault detection by summing instantaneous current values for each phase from the acquired sequential data, and calculate a zero phase current value using the calculated instantaneous current value for fault detection.


Find Patent Forward Citations

Loading…