The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Nov. 05, 2014
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Chuang Zhang, San Diego, CA (US);

Zhengming Fu, San Diego, CA (US);

Nan Chen, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 19/25 (2006.01); G01R 19/32 (2006.01); G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
G01R 19/25 (2013.01); G01R 19/0092 (2013.01); G01R 19/32 (2013.01);
Abstract

In one embodiment, a method for measuring current is described herein. The method comprises shorting first and second inputs of an amplifying circuit to generate a first output signal, and converting the first output signal into an offset cancelation value. The method also comprises passing a current through a power switch, wherein the current generates a voltage drop across the power switch, applying the voltage drop across the first and second inputs of the amplifying circuit to generate a second output signal, and converting the second output signal into a current value. The method further comprises subtracting the offset cancelation value from the current value to generate an offset-compensated current value.


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