The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Aug. 04, 2014
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-Do, KR;
Inventor:
Young-Hyun Kim, Hwaseong-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07342 (2013.01); G01R 1/0408 (2013.01); G01R 31/2886 (2013.01);
Abstract
A tester includes a level controller for independently restricting the central deformation and the peripheral deformation of a probe card. The level controller includes a single upper plate, a single first lower plate and a plurality of second lower plates. A first elastic force is applied to a central portion of the probe card by the first lower plate to restrict the central deformation. Second elastic forces are independently applied to peripheral portions of the probe card by the individual second lower plates to locally restrict the peripheral deformations.