The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Oct. 22, 2013
Applicant:

Multitest Elektronische Systeme Gmbh, Rosenheim, DE;

Inventors:

Gerhard Gschwendtberger, Brannenburg, DE;

Volker Leikermoser, Aschau, DE;

Manuel Petermann, Rosenheim, DE;

Marcus Frey, Bernau, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06733 (2013.01); G01R 1/0466 (2013.01); G01R 1/06738 (2013.01);
Abstract

A contact spring for a testing base for high current testing of an electronic component, which is produced from a spring metal sheet of a predetermined thickness and possesses two identical opposing lateral faces, and which has a spring arm and a testing arm with a testing tip, where the testing arm forms an angle with the spring arm, which enables the testing tip to be positioned on a contact surface of the electronic component running approximately parallel to the spring arm, by relative movement between the testing base and the electronic component.


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