The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Mar. 13, 2013
Applicant:

The Royal Institution for the Advancement of Learning/mcgill University, Montreal, CA;

Inventors:

Aleksander Labuda, Montreal, CA;

Peter Grutter, Montreal, CA;

Yoichi Miyahara, Montreal, CA;

William Paul, Montreal, CA;

Antoine Roy-Gobeil, Outremont, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/24 (2010.01); G01Q 30/06 (2010.01); G01Q 60/34 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/24 (2013.01); G01Q 30/06 (2013.01); G01Q 60/34 (2013.01);
Abstract

Energy dissipation measurements in Frequency Modulation-Atomic Force Microscopy (FM-AFM) should provide additional information for dynamic force measurements as well as energy dissipation maps for robust material properties imaging as they should not be dependent directly upon the cantilever surface interaction regime. However, unexplained variabilities in experimental data have prevented progress in utilizing such energy dissipation studies. The inventors have demonstrated that the frequency response of the piezoacoustic cantilever excitation system, traditionally assumed flat, can actually lead to surprisingly large apparent damping by the coupling of the frequency shift to the drive-amplitude signal. Accordingly, means for correcting this source of apparent damping are presented allowing dissipation measurements to be reliably obtained and quantitatively compared to theoretical models. The methods are non-destructive and can be both easily and routinely integrated into FM-AFM measurements within vacuum environments where measurements exploiting prior art solutions cannot be performed.


Find Patent Forward Citations

Labuda, Aleksander. (2017). Methods and systems for optimizing frequency modulation atomic force microscopy (U.S. Patent No. 9671424). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9671424

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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