The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Oct. 02, 2014
Delphi Technologies, Inc., Troy, MI (US);
Konrad A. Weber, Rehlingen-Siersburg, DE;
David A. Goulette, Marine City, MI (US);
DELPHI TECHNOLOGIES, INC., Troy, MI (US);
Abstract
A method is presented for diagnosing a particulate matter sensing system, where the system includes a sensing element having two electrodes spaced from one another. The method determining at a first time during a cool-down event a first sensing element temperature and a resistance of the sensing element, and determining at a later second time during the cool-down event a second sensing element temperature and the resistance of the sensing element. The method further includes calculating a predicted sensing element resistance at the second sensing element temperature, based on the first sensing element temperature, the resistance of the sensing element determined at the first time, and a predetermined model of the resistance vs. temperature characteristics of the sensing element. A fault condition for the system may be indicated based on a comparison of the predicted sensing element resistance at the second sensing element temperature and a measured sensing element resistance.