The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Dec. 20, 2013
Applicants:

Universiteit Gent, Ghent, BE;

Imec, Leuven, BE;

Inventors:

Peter Bienstman, Ghent, BE;

Tom Claes, Ghent, BE;

Assignees:

UNIVERSITEIT GENT, Ghent, BE;

IMEC VZW, Leuven, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 2021/458 (2013.01);
Abstract

A photonics integrated system is disclosed, comprising a substrate, an integrated interferometer integrated in the substrate and being configured for receiving radiation from a radiation source, and an integrated spectral filter integrated in the substrate and being configured for receiving radiation from the interferometer. The integrated interferometer has a period and the integrated spectral filter has a bandwidth such that the period of the integrated interferometer is smaller than the bandwidth of the integrated spectral filter. The integrated spectral filter has a periodic transfer characteristic with a period and the system has a bandwidth such that the period of the periodic transfer characteristic of the integrated spectral filter is larger than the bandwidth of the system.


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