The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Apr. 24, 2015
Applicant:

Aerosol D.o.o., Ljubljana, SI;

Inventors:

Luka Drinovec, Ljubljana, SI;

Grisa Mocnik, Ljubljana, SI;

Anthony D. A. Hansen, Berkeley, CA (US);

Assignee:

AEROSOL D.O.O., Ljubljana, SI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 15/10 (2006.01); G01N 21/31 (2006.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0625 (2013.01); G01N 15/1012 (2013.01); G01N 21/31 (2013.01); G01N 21/59 (2013.01); G01N 2201/127 (2013.01);
Abstract

An apparatus and method are presented for the analysis of materials. The apparatus includes two or more similar analyzers, with the output of the analyzers combined to provide improved measurements. The apparatus may be, for example, a differential photometric analyzer, such as the AETHALOMETER®. The apparatus includes a processor programmed to accept an instrument constant determined at low filter loadings and use the constant to compensate for non-linear instrument responses. A method is also presented for conditioning filters before use.


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