The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Feb. 02, 2015
Juniper Systems, Inc., Logan, UT (US);
Matthew T. Emerick, Logan, UT (US);
Steven L. Harris, Logan, UT (US);
JUNIPER SYSTEMS, INC., Logan, UT (US);
Abstract
A measurement apparatus may include a holding hopper configured to receive a sample of granular material. The measurement apparatus may include a top barrier assembly coupled between the holding hopper and a sub-sample measurement chamber. The top barrier assembly may include a movable top barrier configured to be moved from a closed position to an open position to direct a sub-sample of granular material to flow from the holding hopper to the sub-sample measurement chamber. The measurement apparatus may include the sub-sample measurement chamber configured to couple to the holding hopper at a docked position to receive the sub-sample of granular material from the holding hopper. The measurement apparatus may include a separator actuator configured to separate the sub-sample measurement chamber from the holding hopper. The measurement apparatus may include one or more measurement sensors configured to measure one or more attributes of the sub-sample of granular material.