The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

May. 20, 2014
Applicant:

Panasonic Intellectual Property Corporation of America, Torrance, CA (US);

Inventor:

Ko Mizuno, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04R 29/00 (2006.01); A61F 11/06 (2006.01); G10K 11/16 (2006.01); H03B 29/00 (2006.01); H04B 15/00 (2006.01); H04R 3/00 (2006.01); G01S 15/08 (2006.01); G01S 15/42 (2006.01); G10K 11/178 (2006.01); H04R 1/08 (2006.01); G01S 15/32 (2006.01); G01S 15/88 (2006.01); G10K 11/18 (2006.01);
U.S. Cl.
CPC ...
H04R 3/002 (2013.01); G01S 15/08 (2013.01); G01S 15/325 (2013.01); G01S 15/42 (2013.01); G01S 15/88 (2013.01); G10K 11/178 (2013.01); H04R 1/08 (2013.01); H04R 3/005 (2013.01); H04R 29/00 (2013.01); G10K 11/18 (2013.01); G10K 2210/128 (2013.01); G10K 2210/3016 (2013.01); G10K 2210/3226 (2013.01); H04R 2410/01 (2013.01); H04R 2410/05 (2013.01); H04R 2499/13 (2013.01);
Abstract

A noise reduction control apparatus and method for detecting a noise signal with a microphone and generating a first control sound for attenuating the noise signal based on control characteristics of a control filter. Further, the first control sound is emitted and measured during a first period. By measuring a sound reflected from an object, a position of the object is estimated. Using the estimated position of the object, the noise is attenuated at the estimated position. Accordingly, it is possible to continuously reduce noise at an estimated position of an object.


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