The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Jan. 30, 2013
Applicant:

Discoverready Llc, New York, NY (US);

Inventors:

James Kenneth Wagner, Jr., Atlanta, GA (US);

John T. Ritter, Charlotte, NC (US);

Stephen John Barsony, King of Prussia, PA (US);

Stephen H. Schreiber, Warren, MI (US);

Merideth L. Helgeson, Charlotte, NC (US);

Macyl A. Burke, Valencia, CA (US);

David Matthew Shub, Cranford, NJ (US);

Yerachmiel Tzvi Messing, Baltimore, MD (US);

Philip L. Richards, Charlotte, NC (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); H04L 12/26 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
H04L 43/06 (2013.01); G06F 17/30011 (2013.01);
Abstract

A sampler tool for an electronic discovery system implementing an electronic discovery workflow is provided. The sampler tool defines a workflow, identifies, a data set, then calculates results and generates reports and archival records. In particular, the sampler tool calculates and/or obtains various metrics characterizing the workflow and generates reports based on such metrics. These reports can serve as historical snapshots which can be used for quality control purposes and/or to provide support regarding the efficacy of the data selection process or large-scale document review in the context of the electronic discovery process. Related apparatus, systems, techniques and articles are also described.


Find Patent Forward Citations

Loading…