The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Feb. 14, 2012
Applicants:

Per-erik Eriksson, Stockholm, SE;

Miguel Berg, Upplands Väsby, SE;

Daniel Cederholm, Sollentuna, SE;

Klas Ericson, Göteborg, SE;

Chenguang LU, Sollentuna, SE;

Inventors:

Per-Erik Eriksson, Stockholm, SE;

Miguel Berg, Upplands Väsby, SE;

Daniel Cederholm, Sollentuna, SE;

Klas Ericson, Göteborg, SE;

Chenguang Lu, Sollentuna, SE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 27/26 (2006.01); H04B 3/46 (2015.01); H04M 3/30 (2006.01); H04L 5/14 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 27/2634 (2013.01); H04B 3/46 (2013.01); H04L 5/14 (2013.01); H04L 27/263 (2013.01); H04L 43/50 (2013.01); H04M 3/306 (2013.01);
Abstract

The present disclosure relates to a Time Duplex Division (TDD) modem and a method in such a modem for making Single Ended Line Test (SELT) measurements. The device comprises a transmitter and a receiver and it has a normal mode of TDD communication. In these devices, Time Domain Reflectometry (TDR) is used as line measurement. It has a number of drawbacks, and for overcoming said drawbacks, Frequency Domain Reflectometry (FDR) measurement techniques adapted for TDD devices are suggested.


Find Patent Forward Citations

Loading…