The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Jun. 28, 2011
Applicant:
Douglas Baney, Santa Clara, CA (US);
Inventor:
Douglas Baney, Santa Clara, CA (US);
Assignee:
Keysight Technologies, Inc., Santa Rosa, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/14 (2015.01); H04B 17/11 (2015.01);
U.S. Cl.
CPC ...
H04B 17/11 (2015.01); H04B 17/14 (2015.01);
Abstract
A method is provided for compensating for impairment of an electrical signal output from a device under test (DUT), the impairment resulting from an impairment network. The method includes measuring an impaired electrical signal received at an electronic analyzer via the impairment network; applying a coded pulse sequence to the impairment network; estimating an impairment transfer function corresponding to the impairment based on the applied pulse sequence; and correcting the measured electrical signal using the impairment transfer function to determine the electrical signal output from the DUT.