The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Apr. 26, 2014
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Herbert Knapp, Munich, DE;

Jonas Wursthorn, Sankt Johann-Wurtingen, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/10 (2015.01); G01R 21/12 (2006.01); G01R 19/00 (2006.01); G01R 21/00 (2006.01);
U.S. Cl.
CPC ...
H04B 17/102 (2015.01); G01R 21/12 (2013.01); G01R 19/00 (2013.01); G01R 19/0084 (2013.01); G01R 19/0092 (2013.01); G01R 21/00 (2013.01);
Abstract

The present invention relates to a millimeter-wave transmitter on a chip comprising at least one transmit path coupleable to an oscillator, and an on-chip power sensor to measure at least a portion of a transmit power transmitted over the at least one transmit path. The present invention further relates to a method of calibrating a millimeter-wave transmitter on a chip and an on-chip power sensor coupleable to at least one transmit path of a millimeter-wave transmitter. The embodiments of the present invention provide a direct measure of transmit power provided within an individual one of the transmit paths of the millimeter-wave transmitter.


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