The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Sep. 22, 2014
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;

Inventors:

Zijin Lin, Beijing, CN;

Haisheng Zhao, Beijing, CN;

Tielin Zhang, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); H01L 21/768 (2006.01); H01L 27/12 (2006.01); G02F 1/1362 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76877 (2013.01); G02F 1/1362 (2013.01); H01L 27/124 (2013.01); H01L 27/1259 (2013.01); G02F 1/136227 (2013.01); G02F 2001/136254 (2013.01); G09G 3/006 (2013.01);
Abstract

An array substrate comprising an electrical connection block exposed to its surface. By manufacturing a passivation layer via hole in a passivation layer, a drain electrode or a pixel electrode of a thin-film transistor is exposed, so that the electrical connection block fills the passivation layer via hole and is provided in contact with the drain electrode or the pixel electrode. Thereby, when the electrical characteristic value of a TFT is measured, the pixel probe of a measuring apparatus may be electrically connected with the drain electrode or the pixel electrode by directly contacting the electrical connection block, so that the measuring of the electrical characteristics of the TFT may be realized.


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