The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Oct. 07, 2016
Applicant:

Commissariat À L'énergie Atomique ET Aux Énergies Alternatives, Paris, FR;

Inventor:

Alexandre Levisse, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/10 (2006.01); G11C 5/14 (2006.01); G11C 11/16 (2006.01); H01L 27/22 (2006.01); H01L 27/24 (2006.01); G11C 13/00 (2006.01); G11C 29/02 (2006.01);
U.S. Cl.
CPC ...
G11C 5/147 (2013.01); G11C 11/1675 (2013.01); G11C 11/1697 (2013.01); G11C 13/0004 (2013.01); G11C 13/0007 (2013.01); G11C 13/0038 (2013.01); G11C 13/0069 (2013.01); G11C 29/021 (2013.01); H01L 27/222 (2013.01); H01L 27/2481 (2013.01); G11C 2013/0078 (2013.01);
Abstract

A memory device having: a cross-point memory array; a current supply circuit adapted to supply a programming current to a selected row line of the array during a programming operation to change the resistive state of a selected memory cell coupled between the selected row line and a selected column line of the array; a leakage current detection circuit coupled to the column lines except the selected column line and adapted to detect leakage currents during the programming operation; and a current limit generation circuit adapted to generate a current limit based on the sum of the leakage currents and on a reference current, and to supply the current limit to the current supply circuit to limit the programming current.


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