The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
May. 20, 2014
Disney Enterprises, Inc., Burbank, CA (US);
Wojciech Jarosz, Zurich, CH;
Iliyan Georgiev, London, GB;
Jaroslav Krivanek, Prague, CZ;
Toshiya Hachisuka, Aarhus, DK;
Derek Nowrouzezahrai, Montreal, CA;
DISNEY ENTERPRISES, INC., Burbank, CA (US);
Abstract
Methods and systems of joint path importance sampling are provided to construct light paths in participating media. The product of anisotropic phase functions and geometric terms across a sequence of path vertices are considered. A connection subpath is determined to join a light source subpath with a light receiver subpath with multiple intermediate vertices while considering the product of phase functions and geometry terms. A joint probability density function ('PDF') may be factorized unidirectional or bidirectional. The joint PDF may be factorized into a product of multiple conditional PDFs, each of which corresponds to a sampling routine. Analytic importance sampling may be performed for isotropic scattering, whereas tabulated importance sampling may be performed for anisotropic scattering.