The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

May. 27, 2014
Applicant:

Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;

Inventors:

Ralf Tanger, Berlin, DE;

Marcus Mueller, Berlin, DE;

Nicola Michael Gutberlet, Berlin, DE;

Peter Kauff, Berlin, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 7/14 (2006.01); G06T 15/00 (2011.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
G06T 15/00 (2013.01); G06T 7/596 (2017.01); G06T 2207/10012 (2013.01); G06T 2207/20088 (2013.01); G06T 2207/20228 (2013.01);
Abstract

A better basis for a further processing such as virtual view rendering, in form of a disparity map is achieved. To this end, the disparity map generation is done in two separate steps, namely the generation of two depth/disparity map estimates based on two different pairs of views of the scene in a manner independent from each other, with then comparing both depth/disparity map estimates so as to obtain a reliability measure for one or both of the depth/disparity map estimates.


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