The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Aug. 06, 2015
Konica Minolta, Inc., Chiyoda-ku, Tokyo, JP;
Junko Kiyohara, Hino, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
An X-ray imaging system includes an X-ray imaging device and an image processing device including a reconstruction unit and an estimation unit. The X-ray imaging device uses a Talbot or Talbot-Lau interferometer including gratings disposed in a line. The X-ray imaging device obtains sets of moire fringe images by fringe scanning multiple times between which arrangement of the gratings is changed. In the fringe scanning, one of the gratings is moved relatively to the remaining grating. The reconstruction unit generates, on the basis of the sets, a reconstructed image which is a differential phase image, an X-ray absorption image and/or a small-angle scattering image. The estimation unit estimates, on the basis of the reconstructed image, a relative position of the moved grating from a reference position of the grating at each imaging in the fringe scanning.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile