Optimizing testing of a partially symmetric quantum-logic circuit by using wreath products and invariance groups

Abstract

Systems and methods for optimized testing of partially symmetric quantum-logic circuits. A test system receives information that describes the architecture of a quantum-logic circuit to be tested. The system uses this information to organize the circuit's inputs into two or more mutually exclusive blocks of inputs. The system computes a wreath product of a set of groups associated with the blocks in order to generate an invariance group that contains one or more invariant permutations of the circuit's inputs. These invariant permutations can be used to reduce the number of tests required to fully verify the circuit for all possible input vectors. Once one specific input vector has been verified, there is no need to test other vectors that can be generated by performing any one of the invariant permutations upon the previously verified vector.